KON 315 - Electronic Instrumentation

Course Objectives

Static (accuracy, sensitivity, linearity etc.) and dynamic characteristics (frequency response, cutoff frequency, damping, natural frequency, etc.) of sensors. Principles of IC-sensors. Resistive signal conditioning circuits : Voltage dividers, linearizing circuits. Balancing and deflection circuits with Wheatstone bridges, load cells. Sensitivity in bridge circuits. Circuits in industrial instrumentation: Instrumentation amplifiers, related notions (CMRR, SMRR, offset, drift, noise) and their effects; chopper amplifiers. Voltage/Current Converters. Shielding and grounding techniques. Signal conditioning for reactance variation sensors; AC bridges; carrier amplifiers; charge amplifiers. Analogue/Digital and Digital/Analogue Converters: Operating principles and characteristics. Data acquisition structures. Telemetry methods. Experiments on various instrumentation circuits : Measurement of temperature, force, strain, displacement, angle, flow, microcontroller controlled measuring systems.

Course Description

Static (accuracy, sensitivity, linearity etc.) and dynamic characteristics (frequency response, cutoff frequency, damping, natural frequency, etc.) of sensors. Principles of IC-sensors. Resistive signal conditioning circuits : Voltage dividers, linearizing circuits. Balancing and deflection circuits with Wheatstone bridges, load cells. Sensitivity in bridge circuits. Circuits in industrial instrumentation: Instrumentation amplifiers, related notions (CMRR, SMRR, offset, drift, noise) and their effects; chopper amplifiers. Voltage/Current Converters. Shielding and grounding techniques. Signal conditioning for reactance variation sensors; AC bridges; carrier amplifiers; charge amplifiers. Analogue/Digital and Digital/Analogue Converters: Operating principles and characteristics. Data acquisition structures. Telemetry methods. Experiments on various instrumentation circuits : Measurement of temperature, force, strain, displacement, angle, flow, microcontroller controlled measuring systems.