Welcome, Guest . Login . Türkçe
Where Am I: Ninova / Courses / Institute of Science and Technology / ELE 517E - Yarıiletken Elemanların ve Düzenlerin Modellenmesi

ELE 517E - Modeling of Semiconductor Components and Systems

Course Objectives

1) Examining of modeling concept
2) To give knowledge about nonlinear models and macromodels of basic electron devices and IC blocks for
computer simulations
3) Ability of designing models and macromodels for electron devices and IC building blocks
4) Ability of deriving new methods to measure model parameters

Course Description

Modeling concept. Modeling of the junction diode: Static and dynamic parameters. SPICE diode model.
Modelling of the BJT. Ebers-Moll equations; EM1 EM2 and EM3 models, Gummel-Poon model, SPICE
BJT model. Modified EM model. JFET models. MOSFET models: SPICE Level-1, Level-2, Level-3 and
Level-4 models, MOSFET models with extended accuracy. Macromodels: Op-Amp., Comparator,
operational transconductance amplifier (OTA), Current Conveyor, Analog Multiplier Macromodels.
Measurement of model parameters.

Course Coordinator
Mustafa Berke Yelten
Course Language
Courses . Help . About
Ninova is an ITU Office of Information Technologies Product. © 2024